Abstract
AbstractA background correction procedure is described for multi‐channel x‐ray fluorescence spectrometers/quantometers with spectrometric channels of a fixed type. The background intensities are measured for a special background sample. Background intensities of the unknown sample are calculated from these measurements with the help of s and f corrections, taking account of qualitative and quantitative differences in the spectral composition of the background radiation for both an unknown specimen and the background sample. Determinations of the major elements in rocks on a multi‐channel x‐ray fluorescence quantometer demonstrated the capabilities of this procedure.
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