Abstract

In this study, an azimuthal-rotation sample holder compatible with scanning transmission X-ray microscopy was developed. This holder exhibits improvement in the accuracy of rotation angles and reduces the displacement of the rotation axes during azimuthal rotation by using a crossed roller bearing. Toevaluate the performance of the holder, the authors investigated the dependence of the optical density around the C K-edge absorption of π-orbital-oriented domains in natural spherical graphite on the rotational angle by using linearly horizontally and vertically polarized undulator radiation. Based on the dependence of the optical density ratio between C 1s → π* and 1s → σ* excitation on the polarization angle of the X-rays, the average two-dimensional orientation angle of the π orbital in each position in a natural spherical graphite sample was visualized.

Highlights

  • The physical properties of carbon materials, such as rubber, polymer-blend resins, carbon fibers, and carbon fiber-reinforced plastics, are based on the domain shape and size of each phase and on the spatial distribution and orientation of their chemical structures in each phase (Miller et al, 1987; Otani & Oya, 1986; Soo-Jin, 2018)

  • Through Scanning transmission X-ray microscopy (STXM), the distribution of orbital orientation can be determined by observing the variations in the optical density (OD) contrast within the field-of-view (FOV) when the sample is rotated at multiple angles in the azimuthal direction of the incident X-rays (Ohigashi et al, 2016; Watts et al, 2011; Watts & Ade, 2008)

  • The dependence of OD on the rotational angle was measured to investigate the domain derived from -orbitals in natural spherical graphite

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Summary

Introduction

The physical properties of carbon materials, such as rubber, polymer-blend resins, carbon fibers, and carbon fiber-reinforced plastics, are based on the domain shape and size of each phase and on the spatial distribution and orientation of their chemical structures (functional groups and chemical bonding) in each phase (Miller et al, 1987; Otani & Oya, 1986; Soo-Jin, 2018). The X-ray absorption (XA) intensity [optical density (OD) is generally used for STXM measurements] reflects the interaction between the polarization of X-rays and the orientation of molecular or chemical bonding orbitals (Hernandez-Cruz et al, 2007; Harano et al, 2017; Watts et al, 2011; Watts & Ade, 2008). Through STXM, the distribution of orbital orientation can be determined by observing the variations in the OD contrast within the field-of-view (FOV) when the sample is rotated at multiple angles in the azimuthal direction of the incident X-rays (Ohigashi et al, 2016; Watts et al, 2011; Watts & Ade, 2008). The performance of the developed azimuthal-rotation sample holder was evaluated

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