Abstract
High Resolution Electron Energy Loss Spectroscopy has been used, with low energy of the primary beam and azimuthal resolution, to study the anisotropy of surface dielectric properties of Si(111)(2 × 1), in the range of the surface electronic excitations. By eliminating the effect of the kinematic prefactor, we are able to obtain from the data the surface Loss Function. Its dependence on q∥ and ω is discussed in term of a model of surface dielectric function.
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