Abstract
The lattice parameters and the axial ratios of f.c.t. In-rich In-Tl alloys doped with given amounts of Cd and/or Sn are measured by X-ray diffractometry. The axial ratio in each series of the doped system decreases gradually with increasing Tl content and discontinuously to unity at the concentration of Tl characteristic to the kind and the amount of doped element. This behavior is quantitatively analyzed by the pseudo-potential method. An additional energy due to short-range interactions is necessarily introduced in order to reach a successful interpretation of the observed trends and of the instability of f.c.c. In with respect to tetragonal distortion.
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