Abstract
Recently we proposed a novel polarimetric method, based on Stokes polarimetry, enabling the characterization of the linear retardance and its flicker amplitude in electro-optic devices behaving as variable linear retarders. In this work we apply extensively the technique to parallel-aligned liquid crystal on silicon devices (PA-LCoS) under the most typical working conditions. As a previous step we provide some experimental analysis to delimitate the robustness of the technique dealing with its repeatability and its reproducibility. Then we analyze the dependencies of retardance and flicker for different digital sequence formats and for a wide variety of working geometries.
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