Abstract

RESUMO Este artigo em duas partes (histórico e análise, seguida da parte de interpretação dos dados obtidos por técnicas analíticas) apresenta um estudo da obra Autorretrato (1919, óleo/tela, 100 x 65 cm) de Amedeo Modigliani, pertencente ao acervo do Museu de Arte Contemporânea da Universidade de São Paulo (MAC USP). Através do cotejamento entre a documentação de procedência da obra, fontes críticas de abordagem da pintura de Modigliani, com as análises técnico-científicas físico-químicas e de imageamento, foi possível reavaliá-la na articulação entre sua materialidade e sua composição, bem como lançar nova luz sobre sua recepção pela crítica dos anos 1950, quando ela chegou ao Brasil e circulou no contexto internacional por meio de publicações e exposições, já como parte de uma coleção brasileira.

Highlights

  • PEDRO HERZILIO OTTONI VIVIANI DE CAMPOS5 https://orcid.org/0000-0003-0022-9289 Universidade de São Paulo / São Paulo, SP, Brasil. This two-part article is a study of Amedeo Modigliani’s Self-Portrait (1919, oil/ canvas, 100 x 65 cm2), which belongs to the Museu de Arte Contemporânea of the Universidade de São Paulo (MAC USP)

  • Imaging measurements made with visible light, raking light, visible UVfluorescence, and infrared reflectography provided a wealth of information on the registration, conservation status and creative process of Amedeo Modigliani’s SelfPortrait

  • The comparison of images made with visible light, Infrared Reflectography (IRR), UV and raking light shows details of the artist’s pencil strokes, and emphasize the contours of the thin black-ink strokes, the thick layer of varnish seen with UV light, and the work’s relatively plain relief, which indicates a thin layer of paint

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Summary

Imaging analyzes

Imaging techniques are important forms of documentation, registry and study of artistic heritage They provide reliable information, generating a unique and characteristic data set. Carbon-based drawing mediums have a high infrared absorption, increasing their reflectance delta in relation to the preparation base. In these cases, the drawing is clearly visible even when the pictorial cover is not highly transparent. During de-excitation, characteristic X-rays are emitted by atoms, collected by the detector, nd processed to generate X-ray spectra pointing to chemical elements, which can be identified and even quantified, if needed This type of analysis is non-destructive because measurements can be performed by positioning the equipment close to the analyzed object, without quite touching it (Figure 9)

Raman Microscopy
Results and discussions of analytical measures
Visible UV
Raman microscopy
FINAL CONSIDERATIONS

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