Abstract

The application of the HP VEE environment for automatic relative permittivity measurement of a lossless dielectric material using a microwave resonant cavity is presented. The measurement configuration is formed using HP 8757A scalar network analyser and an experimental cylindrical metallic cavity with circular cross-section, and the program for automatic measurement of the relative permittivity is developed. Also, the developed program can be applied for the real part of the complex permittivity of low loss dielectric material measurement.

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