Abstract
The postproduction test of integrated circuits is crucial to ensure a high quality of the final product. This test is carried out by checking the correct response of the chip under predefined input stimuli – or test patterns. These patterns are calculated by algorithms for Automatic Test Pattern Generation (ATPG).The basic concepts and algorithms for ATPG are reviewed in this chapter. Then, an advanced SAT-based ATPG tool is introduced and emprically evaluated.
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