Automatic system for the measurement of current gain of the transistor components of power thyristors

Abstract

An automatic measurement system is described which plots current gain of the thyristor—regarded as an npn transistor—versus log frequency on an XY recorder, each curve being for a fixed anode voltage and current. By varying the latter two a series of curves can be recorded within minutes often with improved accuracy what previously could take hours to obtain manually. From these curved the individual current gain of transistor components constituting the thyristor can be quickly evaluated as a function of anode current and voltage.