Abstract
Transmission electron microscopy (TEM) represents a unique and powerful modality for capturing spatial features of nanoparticles, such as size and shape. However, poor statistics arise as a key obstacle, due to the challenge in accurately and automatically segmenting nanoparticles in TEM micrographs. Towards remedying this deficit, we introduce an automatic particle picking device that is based on the concept of variance hybridized mean local thresholding. Validation of this new segmentation model is accomplished by applying a program written in Matlab to a database of 150 bright field TEM micrographs containing approximately 2,000 nanoparticles. We compare the results to global thresholding, local thresholding, and manual segmentation. It is found that this novel automatic particle picking device reduces false positives and false negatives significantly, while increasing the number of individual particles picked on regions of particle overlap.
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