Automatic Segmentation Method for Segmenting PBGA Package and PWB Regions During Warpage Measurement of Unpainted PWB Assembly

Abstract

Among the various warpage measurement techniques, digital fringe projection (DFP) technique is recent trend because of its noncontact, full-field, and high-resolution measurement capabilities for measuring the warpage of chip packages, printed wiring boards (PWBs), and PWB assemblies (PWBAs). When using the DFP technique, reflective painting is generally sprayed on a sample surface to ensure uniform surface reflectance and to obtain better image contrast for the measurement process. However, because painted samples may no longer be reused, and the spray-painting process is not suitable inline, warpage measurement of unpainted chip packages, PWBs, and PWBAs using the DFP technique is required. One of the important tasks for measuring the warpage of unpainted PWBAs is segmentation of the chip package and PWB regions in unpainted PWBA images so that separate warpage of the chip packages and the PWBs can be determined. This paper presents a novel automatic segmentation method, region-growing method (RGM), which segments plastic-ball grid array (PBGA) packages and PWB regions in unpainted PWBA images. The experimental results show that the RGM successfully segments the PBGA package and PWB regions in unpainted PWBA images. The results also show that the RGM can be used in a DFP system to measures the warpage of PBGA packages and PWBs in unpainted PWBAs.