Abstract
The design of an automated inspection system for electronic components on a printed circuit board is presented. The inspection system employs several unique methodologies. They are (1) a normal vector equalization method for separating probable highlights and obtaining two forms of image information, i.e. Lambertian images and specular images, (2) a dual-channel processing strategy for maximizing the utilization of the information concealed in those two types of images, and (3) a proximity-measure-based decision-making algorithm for detecting defective components. The system has been tested for several PC boards and experimental results have shown promise. >
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