Automatic generation of test vectors for SCR-style specifications

Abstract

This paper provides the basis for integrating the Software Cost Reduction (SCR) specification method with the T-VEC (Test VECtor) test vector generator and specification analysis system. The SCR model is mapped to the T-VEC model to support automatic test vector generation for SCR specifications. The T-VEC system generated test vectors for an example SCR specification that was translated into the T-VEC language. The relationships between the models and the resulting test vectors are described. Two general guidelines for the translation process were identified that are fundamental for testing specifications that use event operators and for structuring the specifications to provide tests for all specified requirements.