Abstract
� Abstract—This research proposes a novel approach that applies DCT based enhancement for the detection of pinhole defects on SBL chips. A two-stage decomposition procedure is proposed to extract an odd-odd frequency matrix after a digital image has been transformed to DCT domain. The cumulative sum algorithm is then proposed to detect the transition points of the gentle curves plotted from the odd-odd frequency matrix. After the transition points are determined, the best radius of the cutting sector is computed and the high-pass filtering operation is implemented. The filtered image is then inversed and transformed back to the spatial domain. Finally, the restored image is segmented by an entropy method and some defect features are calculated. Experimental results show the proposed pinhole defect detection method can reach the pinhole defect detection rate by 90% and decrease the deviation of the defect areas by 90%.
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