Abstract
A highly sensitive and automated technique has been developed for measuring the birefringence in transparent optical materials. The spatially scanning modulated transmission ellipsometer maps the birefringence of a transparent material by probing it with a polarization-modulated He-Ne laser beam. Computer-controlled voltage biasing of a Pockels cell permits self-calibration and background subtraction of the system retardance. The technique is capable of resolving differential retardances as small as 0.1 nm (λ/6328) through a range of ±λ/2, where λ = 632.8 nm. Samples typically range in size from 50 µm to 10 cm in diameter within the sample plane and as much as 400 mm along the optical axis.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.