Abstract
In this article, a Shack-Hartmann wavefront sensor is combined with a mechatronic positioning system to overcome the limited dynamic range of the Shack-Hartmann sensor (SHS) by repositioning and reorienting the SHS. Feedback loops to ensure a tangential orientation of the wavefront sensor in every measurement position and a measurement strategy that compensates for tip and tilt between wavefront and sensor are described and implemented. A framework that estimates the admissible measurement trajectories by relating the positioning errors caused by misalignments of the stages to the parameters of the wavefront sensor is developed. It is demonstrated that the setup is capable of directly measuring a highly divergent optical wavefront by combining wavefront data and positioning data acquired along the wavefront generated by a microscope objective with numerical aperture (NA) of 0.45.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEE Transactions on Instrumentation and Measurement
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
