Abstract
Electron diffraction tomography (EDT) has gained increasing interest, starting with the development of automated electron diffraction tomography (ADT) which enables the collection of three-dimensional electron diffraction data from nano-sized crystals suitable for ab initio structure analysis. A basic description of the ADT method, nowadays recognized as a reliable and established method, as well as its special features and general applicability to different transmission electron microscopes is provided. In addition, the usability of ADT for crystal structure analysis of single nano-sized crystals with and without special crystallographic features, such as twinning, modulations and disorder is demonstrated.
Highlights
Crystalline nanomaterials from industrial as well as natural sources are present in nearly every aspect of our live
In the case of the continuous rotation electron diffraction method (Cichocka et al, 2018), which follows the same strategy as MicroED, the naming might be misleading because it does not use the strategy of the RED method
These materials are typically affected by pervasive defects, such as mutual layer shifts that produce diffraction streaks along c*, which could made be visible by HRTEM imaging
Summary
In addition to dynamic disorder caused by atomic vibrations, static disorder is quite often the case in crystalline materials (Hull & Bacon, 2011). The short-range order can be determined by an interpretation of the diffuse scattering between the Bragg reflections, see point (iii) Such an interpretation can be carried out by deriving an analytical model for the studied defect or by simulating disordered crystals and calculating the diffraction pattern from this model. For the extraction of diffuse scattering, the data has to be reconstructed with a high voxel resolution and the orientation matrix of the average structure has to be defined This information is, in principle, enough to define planes or pathways of interest in order to project the data in image files and/or text files with pixel positions and related intensities.
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
