Abstract
A backscatter Kikuchi diffraction attachment to an SEM enables the convenient investigation of individual grain orientations on bulk surfaces. Their relation to microstructural features gives insight into many aspects of anisotropic materials properties. The formation of backscatter Kikuchi patterns and the experimental set-up for their acquisition are briefly outlined. The interactive and automated indexing of patterns and the fully Automated Crystal lattice Orientation Mapping (ACOM) with a computer-controlled SEM are presented in detail. Digital beam scan requires, as a consequence of the high tilt of the specimen with respect to the beam, current calculation of pattern centre and diffraction length (autocalibration) and dynamic focusing by the software. The automated measurement of lattice orientations takes less than half a second per image point on a Pentium Pro 200 MHz PC. Crystal lattice orientation maps (COM) are constructed by assigning to each grid point in the image a colour specific for the grain orientation, the misorientation or the grain boundary character. For a quantitative representation of the spatial distribution of microscale texture, an orientation-to-colour key is used by colour shading inverse pole figures, sections through Euler space or sections through Rodrigues orientation space. Texture components of interest can be highlighted by distinct colours in order to reveal textural inhomogeneities. Typical applications are given.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.