Author's reply [to comments on "A shield-based three-port de-embedding method for microwave on-wafer characterization of deep-submicrometer silicon MOSFETs"

Abstract

For original article by Ming-Hsiang Cho et al. see ibid., vol.53, no.9, p.2926-34, Sep. 2005. For comments by T. Kaija and P. Heino see ibid., vol.54, no.3, p.1295-6, March 2006.