Abstract
The reaction sequence in the BaTiO3−Nb2O5−Bi2O3 system leading to the core-shell microstructure that causes the temperature-stable dielectric response has been examined using X-ray diffraction. The starting oxides react to form bismuth oxide layer Aurivillius phases at low temperatures which, in turn, react with remnant oxides to form the tetragonal tungsten bronze phase, Ba4Bi2Ti4Nb6O30, which acts as the source of dopants responsible for core-shell formation.
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More From: Journal of Materials Science: Materials in Electronics
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