Abstract
Iron was evaporated onto freshly cleaved Si crystal surfaces in amounts that were calibrated to 0.02 monolayers. Calibration was achieved using a piezoelectric mass detector which could intercept the Fe beam. The 44 eV Auger peak in the Si spectrum had an intensity which, if it were all due to Fe, corresponded to 0.3 monolayers. However it developed into a 46 eV peak after Fe deposition. LEED spectra changed from (2 × 1) to (1 × 1) after fractional monolayer Fe deposition and the pattern disappeared after 3 monolayers, which corresponded to onset of ferromagnetic properties in Fe. Heat treatment to 950°C restored a (1 × 1) LEED pattern and partially restored the Si Auger spectra. There was no evidence that any fractional order LEED patterns were associated with Fe impurities.
Published Version
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