Abstract
Quantitative calculations are reported of both band-to band Auger and radiative recombination lifetimes in thin-layered type II InxGa1−x Sb/InAs superlattices with energy gaps in the 5–17 μm range, using accurate band structure and numerical techniques. Results for an 11 μm superlattice are compared with similar calculations for bulk HgCdTe and a HgTe/CdTe superlattice having the same energy gap. The results show the n-type Auger rates to be comparable and the p-type rates to be suppressed by three orders of magnitude in some experimentally realizable structures. Thus, well fabricated III–V superlattices appear to be excellent candidates as a new class of infrarer detectors.
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