Auger electron spectroscopy of dentin: elemental quantification and the effects of electron and ion bombardment

Abstract

Auger electron spectroscopy was used in this investigation to quantify the elemental composition of various dentin surfaces. The surfaces included the “smeared layer,” produced by abrasion, as well as surfaces prepared by fracturing in vacuum and in air. Quantification was aided by spectra obtained from standard samples of the two main components of dentin, hydroxyapatite, and collagen. Experimental conditions were found whereby the samples could be analyzed without conductive coatings. Ion sputter etch rates were measured for dentin, hydroxyapatite, and collagen. Under the conditions used here, it was observed that collagen etched at a rate approximately five times greater than hydroxyapatite. Auger spectra of the sputtered surfaces indicated significant ion beam-induced sample changes in collagen and dentin; no significant changes were found with hydroxyapatite. The results of this investigation demonstrate that Auger electron spectroscopy can be used to characterize dentinal surfaces and that ion sputtering can cause changes in the surface composition of dentin.