Abstract
The interaction of gold with CeO2 layers was investigated using photoelectron spectroscopy. 65 nm thick Au doped CeO2 layers were deposited by rf-magnetron sputtering on a Si(0 0 1) substrate by using a composite CeO2–Au target. The laboratory XPS and synchrotron radiation soft x-ray and hard x-ray photoemission spectra showed the formation of stoichiometric Ce4+ (CeO2) and the appearance of new Au+,3+ states with ionized Au species in excess of 50% of the total Au amount. Depth resolved measurements, by varying the emission angle or photon energy, indicated the formation of an Au0 overlayer and deeper Au+,3+ species. The formation of Au+,3+ ions was found to be strongly dependent on the cerium oxide stoichiometry. The amount of ionized Au can be reversibly decreased and increased by surface reduction (removal of O by sputtering) and subsequent surface re-oxidation.
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