Abstract
The issues concerning the stability of contact systems in GaSb photovoltaic converters and their reliability enhancement have been considered. It is established that at thermally induced degradation conditions (i.e., at the constant heat load at 80, 120, and 200 °C), the contacts with a conducting Ag layer, namely, Ti-Pt-Ag, Ti-Pt-Ag-Au, Cr-Au-Ag-Au have an advantage over those of conducting Au layer, i.e., Ti-Pt-Au, Cr-Au, while silver-containing metallization Ti-Pt-Ag and Ti-Pt-Ag-Au are more stable under temperature than Cr-Au-Ag-Au one.
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