Abstract
In this paper the attenuation length measurements in lead arachidate [(C19H39COO)2Pb] Langmuir Blodgett films deposited on copper was reported on. A discrete layer model appropriate to the ordered structure of these built up films is applied to the measurements of the x-ray photoemission intensity variation with electron takeoff angle and attenuation lengths for Pb 4f7/2, O 1s and Cu 2p3/2 electrons (kinetic energy range 550–1350 eV) are determined. There is evidence for the dependence of the attenuation length on the dielectric properties of the film/substrate interface through a variation of the film thickness.
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