Abstract

By harnessing the physically unclonable properties, true random number generators (TRNGs) offer significant promises to alleviate security concerns by generating random bitstreams that are cryptographically secured. However, fundamental challenges remain as conventional hardware often requires complex circuitry design, showing a predictable pattern that is susceptible to machine learning attacks. Here, a low-power self-corrected TRNG is presented by exploiting the stochastic ferroelectric switching and charge trapping in molybdenum disulfide (MoS2 ) ferroelectric field-effect transistors (Fe-FET) based on hafnium oxide complex. The proposed TRNG exhibits enhanced stochastic variability with near-ideal entropy of ≈1.0, Hamming distance of ≈50%, independent autocorrelation function, and reliable endurance cycle against temperature variations. Furthermore, its unpredictable feature is systematically examined by machine learning attacks, namely the predictive regression model and the long-short-term-memory (LSTM) approach, where nondeterministic predictions can be concluded. Moreover, the generated cryptographic keys from the circuitry successfully pass the National Institute of Standards and Technology (NIST) 800-20 statistical test suite. The potential of integrating ferroelectric and 2D materials is highlighted for advanced data encryption, offering a novel alternative to generate truly random numbers.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.