Abstract

Epitaxial metal/semiconductor superlattices with atomically sharp interfaces and tunable Schottky barrier heights have attracted significant interest in recent years for thermionic emission-based high-temperature thermoelectric devices, optical hyperbolic metamaterials, hot-electron photocatalysis, and optoelectronic heterostructures for visible-to-terahertz frequency range applications. ZrN/ScN is a demonstration of such epitaxial metal/semiconductor superlattices and exhibits atomically sharp lattice-matched interfaces, albeit with the presence of threading dislocations on MgO substrates. Along with its influence on structural integrity and atomic diffusion, the presence of such defects significantly impacts electron and phonon transport in these metamaterials with carrier trapping, scattering, shunt path, etc. Therefore, an in-depth analysis of the atomistic structure and the composition of such defects is extremely necessary to design devices with improved efficiencies. In this paper, high-resolution scanning transmission electron microscopy and atom-probe tomography are employed to determine the structure and three-dimensional (3D) spatial distribution of oxide defect clusters along the voids in ZrN/ScN superlattices. $\mathrm{Sc}{\mathrm{O}}^{+}$ and $\mathrm{Sc}{\mathrm{O}}^{++}$ ions are found to cluster predominantly along such 3D interface defects with zirconium and scandium atoms surrounding them. Defect regions are also found to be depleted of nitrogen atoms and rich with a high concentration of oxygen. The oxygen content was found to be higher inside the ScN layers compared to ZrN. First-principles modeling analysis verified the clustering of oxygen at high oxygen partial pressure and demonstrated a higher affinity of scandium towards oxygen than for zirconium towards oxygen. These results mark significant progress in understanding the atomic structure and composition of defects in nitride superlattices.

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