Abstract
We present a simple theoretical model of the scanning force microscopy experiment using an atomistic simulation technique. The scanning of the perfect (100) surfaces of NaCl and LiF, the Mg2+ impurity ion on the surface of LiF, and the monoatomic step edge on the surface of NaCl were modeled at different constant vertical forces exerted on the tip. The calculations were made using an atomistic treatment of the interaction between a crystalline sample and tip nanoasperity combined with a semiempirical treatment of the mesoscopic van der Waals attraction between tip and surface and the macroscopic parameter of cantilever deflection. Comparing these results with experimental data, we discuss the quality of our model and the different conditions of surface imaging with atomic resolution.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
