Abstract

Nanocrystallography has transformed our ability to interrogate the atomic structures of proteins, peptides, organic molecules and materials. By probing atomic level details in ordered sub-10 nm regions of nanocrystals, scanning nanobeam electron diffraction extends the reach of nanocrystallography and in principle obviates the need for diffraction from large portions of one or more crystals. Scanning nanobeam electron diffraction is now applied to determine atomic structures from digitally defined regions of beam-sensitive peptide nanocrystals. Using a direct electron detector, thousands of sparse diffraction patterns over multiple orientations of a given crystal are recorded. Each pattern is assigned to a specific location on a single nanocrystal with axial, lateral and angular coordinates. This approach yields a collection of patterns that represent a tilt series across an angular wedge of reciprocal space: a scanning nanobeam diffraction tomogram. Using this diffraction tomogram, intensities can be digitally extracted from any desired region of a scan in real or diffraction space, exclusive of all other scanned points. Intensities from multiple regions of a crystal or from multiple crystals can be merged to increase data completeness and mitigate missing wedges. It is demonstrated that merged intensities from digitally defined regions of two crystals of a segment from the OsPYL/RCAR5 protein produce fragment-based ab initio solutions that can be refined to atomic resolution, analogous to structures determined by selected-area electron diffraction. In allowing atomic structures to now be determined from digitally outlined regions of a nanocrystal, scanning nanobeam diffraction tomography breaks new ground in nanocrystallography.

Highlights

  • A prominent bottleneck to the determination of atomic molecular structures is their formation of well ordered single crystals of a suitable size

  • Structural irregularities in a crystal can result in a loss of diffracting power, challenges in data reduction and increases the difficulty of structure determination (Nave, 1998)

  • Intensities recorded by either (1) nanobeam electron-diffraction tomography (NanoEDT) and MicroED, (2) NanoEDT and discrete-angle diffraction or (3) MicroED and discrete-angle diffraction were merged together using SCALEPACK (Minor et al, 2006) to ensure that only reflections measured by both methods were compared in subsequent analysis

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Summary

Introduction

A prominent bottleneck to the determination of atomic molecular structures is their formation of well ordered single crystals of a suitable size. Structural irregularities in a crystal can result in a loss of diffracting power, challenges in data reduction and increases the difficulty of structure determination (Nave, 1998). Microfocused X-ray beams overcome some of these challenges, reducing the lower-size limits of crystals from hundreds of micrometres to below ten micrometres (Smith et al, 2012). Serial crystallography at both synchrotron (Nogly et al, 2015) and X-ray free-electron laser sources (Schlichting, 2015) has further reduced crystal-size limits to the sub-micrometre scale at the cost of requiring large numbers of crystals. The recent renaissance in electron diffraction allows the study of three-dimensional microcrystals (MicroED or cRED)

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