Abstract

Combining orientation dependent electrically detected magnetic resonance and g tensor calculations based on density functional theory we assign microscopic structures to paramagnetic states involved in spin-dependent recombination at the interface of hydrogenated amorphous silicon crystalline silicon (a-Si:H/c-Si) heterojunction solar cells. We find that (i)the interface exhibits microscopic roughness, (ii)the electronic structure of the interface defects is mainly determined by c-Si, (iii)we identify the microscopic origin of the conduction band tail state in the a-Si:H layer, and (iv)present a detailed recombination mechanism.

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