Abstract
Atom-probe field-ion microscopy was used to measure quantitatively ${\ensuremath{\gamma}}_{\mathrm{Ag}}$, the absolute values of the Gibbsian interfacial excess of Ag, at semicoherent MgO/Cu(Ag) ${222}$ heterophase interfaces. Atomically clean metal oxide/metal heterophase interfaces were obtained by internal oxidation of a pure ternary Cu(Mg,Ag) single-phase alloy to produce octahedral-shaped MgO precipitates, 10 to 30 nm in diameter, in a single-phase Cu(Ag) matrix. The measured value of ${\ensuremath{\gamma}}_{\mathrm{Ag}}$ at 500 \ifmmode^\circ\else\textdegree\fi{}C is $(2\ifmmode\pm\else\textpm\fi{}0.6)\ifmmode\times\else\texttimes\fi{}{10}^{15}$ atoms c${\mathrm{m}}^{--2}$.
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