Abstract
We report the first atomic scale imaging and spectroscopic measurements of electrontrap states in completely non-conducting surfaces by dynamic tunnelling forcemicroscopy/spectroscopy. Single electrons are dynamically shuttled to/from individualstates in thick films of hafnium silicate and silicon dioxide. The new method opens upsurfaces that are inaccessible to the scanning tunnelling microscope for imaging andspectroscopy on an atomic scale.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.