Abstract
We present simultaneous imaging of TiO2(110)-(1 x 1) and - (1 x 2) using noncontact atomic force microscopy (NC-AFM) and scanning tunneling microscopy (STM). The surface topography was imaged under NC-AFM feedback, while the surface electronic states were imaged by STM. The image contrasts of NC-AFM and STM were antiphase in (1 x 1) and in phase in (1 x 2). The uppermost oxygen and Ti atoms underneath were, respectively, imaged by NC-AFM and STM. The NC-AFM image contrast was close to the true surface topography in (1 x 2), but reduced in (1 x 1).
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