Atomic relocation in ion-bombarded ultra-thin films analyzed with sub-nm spatial resolution

Abstract

The displacement of atoms in a magnetic trilayer Fe (10nm)/Cr (0.7nm)/Fe (10nm) system by 30keV Ga+ ion irradiation was studied by 3D Atom Probe Tomography (APT). From APT, the positions of individual Cr and Fe atoms could be located with sub-nm spatial resolution, both before and after ion bombardment. In the pristine specimen the presence of the 0.7-nm Cr layer was identified and individual lattice planes with a distance of ∼0.15nm were observed which would correspond to the monolayer spacing of the Fe lattice, in agreement with the growth process. Upon irradiation, the Cr layer broadens to ∼1.2nm at a fluence of 3×1014Ga+/cm2 and to ∼3.4nm at 3×1015Ga+/cm2. From this broadening the mean squared relocation distance of (Cr) atoms was derived, 〈r2〉 ∼0.4nm2. Computer simulations indicate that, at a fluence of 3×1014Ga+/cm2, each Cr atom in the intermediate layer is displaced on average once in the collision processes. The distribution of implanted Ga ions appears to exhibit discontinuities at the Fe/Cr interfaces which might be caused by a demixing of Ga at the Cr layer.