Abstract
Tip-enhanced Raman scattering (TERS) has recently demonstrated the exceptional sensitivity to observe vibrational structures on the atomic scale. However, it strongly relies on electromagnetic enhancement in plasmonic nanogaps. Here, we demonstrate that atomic point contact (APC) formation between a plasmonic tip and the surface of a bulk Si sample can lead to a dramatic enhancement of Raman scattering and consequently the phonons of the reconstructed Si(111)-7 × 7 surface can be detected. Furthermore, we demonstrate the chemical sensitivity of APC-TERS by probing local vibrations resulting from Si–O bonds on the partially oxidized Si(111)-7 × 7 surface. This approach will expand the applicability of ultrasensitive TERS, exceeding the previous measurement strategies that exploit intense gap-mode plasmons, typically requiring a plasmonic substrate.
Highlights
Tip-enhanced Raman scattering (TERS) has recently demonstrated the exceptional sensitivity to observe vibrational structures on the atomic scale
The plasmonic field confinement at the scale of tens of nanometers is readily achieved with various nanostructures.[2]
As an attempt to overcome this obstacle, here we demonstrate that an atomic point contact (APC) between a plasmonic tip and a nonplasmonic surface can dramatically enhance Raman scattering and that the phonon modes of the Si(111)-7 × 7 surface can be observed
Summary
Tip-enhanced Raman scattering (TERS) has recently demonstrated the exceptional sensitivity to observe vibrational structures on the atomic scale. As an attempt to overcome this obstacle, here we demonstrate that an atomic point contact (APC) between a plasmonic tip and a nonplasmonic surface can dramatically enhance Raman scattering and that the phonon modes of the Si(111)-7 × 7 surface can be observed.
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