Abstract
Aberration corrected HRTEM has been successfully applied to image the atomic motion at the edges and surfaces of nanoparticles of ceria of various types under electron irradiation. Here we identify movements not only on {100} facets, but also on {110} and even {111} facets, previously considered stable. However, the degree of movement varies strongly and HRTEM is evidently the preferred technique to measure relative stability at high spatial resolution as it does not require extended surfaces as in scanning probe microscopy (SPM) or chemical methods. The advantage of aberration correction shows in suppression of contrast from the carbon support films and the absence of delocalisation fringes at particle edges, apart from improving point resolution.
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