Abstract
A series of systematic electron microscopy imaging evidence are illustrated to prove that a high-quality interface is vital for enhancing quantum efficiency from 23 to 50% effectively, because improved crystal quality of each layer can suppress the disordered atom arrangement and enhance the carrier lifetime via decreasing the overall residual strain. The distribution width of charge rises and then falls as bias increasing, revealing the existence of an optimum operating voltage, which could be attributed to the proper energy band bending. Our results provide new insights into the understanding of the association between macro-property and microstructure of the superlattice system.
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