Abstract

Ce-doped yttrium aluminum garnet (YAG:Ce, Y3Al5O12:Ce) is the most commonly used yellow phosphor in white light-emitting diodes. Recently, we found that (Y1–xCex)3Al5O12:Ce with a super-high content of Ce (x = 0.11–0.21) can be prepared by a polymerized complex method and exhibits anomalous orange–red emission. To understand the nature of this anomalous behavior from the atomic level, we applied high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and scanning transmission electron microscopy–energy dispersive X-ray spectroscopy (STEM-EDS), a state-of-the-art technique that enables analysis of the atomic-level elemental distributions of Al, Y, and Ce. STEM-EDS images on the atomic level were successfully obtained for YAG:Ce. It was found that Ce in Y site has spatially uneven for few nanometers. Ce–K edge extended X-ray absorption fine structure (EXAFS) analysis was also conducted, which revealed a high level of asymmetry around Ce. By combining the STEM-EDS and EXAFS results, a dynamic model for the red emission was proposed. STEM-EDS also revealed that CeO2 nanocrystals were firstly formed with low-temperature annealing and that the reaction of Y with the CeO2 nanocrystals subsequently yielded YAG:Ce, unlike in the conventional one-step high-temperature synthesis.

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