Atomic-Level Insights into the Radiation Damage and Recovery of β-Ga2O3 for High-performance Semiconductors.

Hsien-Lien Huang, Alexander Senckowski + Show 6 more

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https://doi.org/10.1093/micmic/ozad067.756

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Journal: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Publication Date: Jul 22, 2023

Affiliation: The Ohio State University, University of Massachusetts Lowell, University at Buffalo, State University of New York

#Atomic-Level Insights #Radiation Damage + Show 1 more

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Atomic-Level Insights into the Radiation Damage and Recovery of β-Ga2O3 for High-performance Semiconductors.

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