Abstract
Results of Atomic Force Microscopy (AFM) on carbon fibers from polyacrylonitrile and pitch are presented in comparison with Scanning Electron Microscopy (SEM) and Scanning Tunneling Microscopy (STM) images. Single fiber surfaces and their crosssections have been imaged on scales from microns to nanometers. Morphological details beyond the resolution of SEM were revealed by AFM and STM. Grain-type structure was verified on surface of numerous nanofibrils orlented along the main fiber direction. Grains are bigger on pitch-based fibers generally, and on fibers of both types after treatment at higher temperatures. In the atomic scale AFM images traces of graphitic structure were recorded. AFM artefacts on rough surfaces are demonstrated. ac19920414
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
