Abstract
In this work, we describe a new method for characterizing surface acid-base properties by surface force measurements using an atomic force microscope (AFM) in a liquid electrolyte. The potential of AFM is to make possible the local study of surface acid-base properties of rough and inhomogeneous substrates. We demonstrate the technique by measuring the force profile between a SiO 2 substrate and the Si 3 N 4 AFM tip over a wide range of pH in an aqueous electrolyte. These first results are satisfactorily compared to the DLVO theory; we can infer that the surface isoelectric point (IEP) of the Si 3 N 4 AFM tip has a value of 6.0±0.4
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