Abstract
Scanning probe microscopy was used to investigate electrical microcontacts in the nanometer range. With the atomic force microscope current flowing through the contact as well as current-voltage characteristics of the contact as a function of the force acting on the contact itself were recorded. With the scanning tunneling microscope current-voltage characteristics and voltage at constant current characteristics were measured as a function of the contact position. From these experiments we conclude that a TiB2 microcontact can sustain a maximum voltage of about 0.1–1 V before melting. These results were confirmed by a theoretical model. The implications for the functioning of so-called positive temperature coefficient current limiting devices based on filled polymers is discussed.
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