Abstract
Atomic emission spectroelectrochemistry (AESEC) was used to monitor the dissolution of alloying elements during the anodization process of AA7050-T74 alloy. This technique coupled with metallographic analysis of the alloy lead to the identification of defects formed in the anodized layer due to the dissolution of strengthening intermetallic compounds (Al 2CuMg and MgZn 2) and coarse compounds (Al 7Cu 2Fe). The rates of the dissolution phenomena were measured independently as a function of the applied voltage.
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