Abstract
We report on the first atom trap trace analysis (ATTA) measurements of Kr in Xe samples with Kr/Xe concentrations of \U0001d4aa(10 ppt) and \U0001d4aa(100 ppt). The ATTA results were independently confirmed by measurements of the same samples with a rare gas mass spectrometer. Measurements of samples with Kr/Xe concentrations below these levels were inhibited by a residual Kr background in the ATTA apparatus, attributed to a cumulative cross sample contamination due to the radio frequency plasma discharge source region from tests with Kr-rich gas samples.
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