Abstract
ABSTRACTAs the individual layer of Ti is reduced in thickness in a Ti/Nb multilayered thin film structure, the Ti layer can undergo a change in phase stability fromhcptobcc. Due to its high spatial resolution, atom probe tomography (APT) is ideally suited to characterize the compositional variations in such thin film structures. A series ofhcpTi /bccNb andbccTi /bccNb multilayers have been sputtered deposited and prepared as APT specimens using a Focus Ion Beam (FIB) milling procedure. The APT results have shown a substantial interdiffusion of Nb into thebccTi layers to a pseudo-equilibrium concentration of approximately Ti-20at%Nb while maintaining a compositionally modulated interface. In contrast, thehcpTi layers indicated little Nb interdiffusion within the layers. Thermodynamic volumetric free energy modeling has indicated that this unexpected Nb interdiffusion facilitated thebccphase stability. The coupling of APT results to the pseudomorphicbccTi phase demonstrates the capability APT has in quantifying the compositional characteristics in these types of multilayered nanocomposite systems.
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