Atom Probe Field Ion Microscopy of Titanium Aluminides

Abstract

Abstract Titanium aluminides have a number of potential high temperature applications due to their good elevated-temperature mechanical properties, low density, and good creep and oxidation resistance. However, fabrication of commercial components of these materials has been impeded by their poor mechanical properties at ambient temperatures. Significant efforts with various degrees of success have been made to improve the mechanical properties of these TiAl alloys by doping them with a variety of different elements including B, C, Cr, Er, Fe, Mn, Mo, Ni, Nb, P, Si, Ta, V and W. One of the optimum analytical tools for investigating the effects of these additions on the microstructure is the atom probe field ion microscope. However, relatively few studies of titanium aluminides, compared to some other intermetallic compounds, have performed by atom probe field ion microscopy. This lack of attention can be attributed to the brittle nature of the material, in-situ transformations that occur during the field ion microscopy and preferential evaporation problems that were encountered in some of the early studies.