Atom probe characterisation of high temperature materials

Abstract

An atom probe is capable of quantitatively analysing materials at the atomic level. Modern atom probes are derived from the field ion microscope, and are coupled with time-of-flight mass spectrometers, permitting identification of individual atoms. The introduction of position-sensitive detectors enables the reconstruction of a small volume of the sample owing to simultaneous determination of the x, y, and zcoordinates and the mass to charge ratios of individual atoms. This paper focuses on the application of atom probe techniques to the microstructural analysis of high temperature materials. Illustrations include carbide precipitation in creep resistant power plant steels and analyses of model and commercial multicomponent nickel based superalloys. It is demonstrated that atom probe field ion microscopy and atom probe tomography are valuable techniques in the development and understanding of technologically important alloys for high temperature service.