Abstract
AbstractAtom‐probe micronalysis has a very high spatial resolution and equal detectivity for all elements, including the lightest. It is therefore well suited for the study of grain boundary segregation. In this paper the accuracy and spatial resolution of atom‐probe analysis are discussed, as well as the advantage of and limitations to the method. Specimen preparation methods are descibed, in particular controlled preparation using electron microscopy and pulse electropolishing. Three examples of atom‐probe studies of grain boundary segregation are given: cobalt segregation to carbide grain boundaries in cemented carbide materials; boron grain boundary segregation in austenitic stainless steels; and nickel segregation to grain boundaries in tungsten.
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