ATML completion status

Abstract

The IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML (IEEE Std 1671™-2010) [1] and all its ‘dot’ standards have been published and are available from the IEEE. The ATML standards working group is now revising these trial use ‘dot’ standards to match their current XML schemas in line with the full use IEEE Std 1671. The Common ATML XML schemas are posted to an IEEE download site on the World Wide Web, available for download and use. In short, the ATML standard and it's ‘dot’ companions are now published, available, and their associated XML Schemas are downloadable from the Web, and in use across industry. This paper provides: a) An explanation as to the rational behind each of the ATML components; representing ATML companion ‘dot’ standards, as well as the use and reliance of existing IEEE standards IEEE Std 1641™ (STD) [2]. b) An explanation of how each companion ‘dot’ standard relates to each other, and how they may come together to provide the synergistic ATML Framework defined by IEEE Std 1671™-2010[1]. c) An explanation as to how each component ‘dot’ standard can be used standalone; and how each can be used with other component ‘dot’ standards to provide for ever increasing interoperable test systems. d) An explanation on how ATML allows user extensions as a core mechanism to promote common Automatic Test System (ATS) information interchange Finally, the paper explains the common misconceptions associated with test information interchange and explains how the ATML family of standards is an ideal solution for test information interchange across different and varied platforms, for test systems of today and into the future.